| The ISD-SC6550D-E2CVL is Hikvision’s top-tier dual-view x-ray baggage inspection system, designed to deliver comprehensive scanning accuracy across two angles simultaneously. This model is engineered for high-threat environments where detecting concealed or layered objects is critical, such as airports, border security, seaports, courthouses, and high-security government installations.
Its large tunnel (650 mm × 500 mm) supports varied baggage sizes, and its dual x-ray generator system allows for orthogonal (horizontal and vertical) scanning. This ensures minimal blind spots and enables precise 3D-like visibility into complex luggage contents, making it far superior to traditional single-view scanners. |

